| Title | Author(s) | Issue date | ???itemlist.??? |
| Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets | Kavousianos, X.; Tenentes, V.; Chakrabarty, K.; Kalligeros, E. | 24-Nov-2015 | - |
| Efficient Partial Scan Cell Gating for Low-Power Scan-Based Testing | Kavousianos, X.; Bakalis, D.; Nikolos, D. | 24-Nov-2015 | - |
| Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects | Kavousianos, X.; Chakrabarty, K. | 24-Nov-2015 | - |
| Low power built-in self-test schemes for array and booth multipliers | Bakalis, D.; Kavousianos, X.; Vergos, H. T.; Nikolos, D.; Alexiou, G. P. | 24-Nov-2015 | - |
| Multilevel Huffman coding: An efficient test-data compression method for IP cores | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Multilevel-Huffman test-data compression for IP cores with multiple scan chains | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Multiphase BIST: A new reseeding technique for high test-data compression | Kalligeros, E.; Kavousianos, X.; Nikolos, D. | 24-Nov-2015 | - |
| A new built-in TPG method for circuits with random pattern resistant faults | Kavousianos, X.; Bakalis, D.; Nikolos, D.; Tragoudas, S. | 24-Nov-2015 | - |
| New efficient totally self-checking Berger code checkers | Kavousianos, X.; Nikolos, D.; Foukarakis, G.; Gnardellis, T. | 24-Nov-2015 | - |
| Novel single and double output TSC CMOS checkers for m-out-of-n codes | Kavousianos, X.; Nikolos, D.; Sidiropoulos, G. | 24-Nov-2015 | - |
| On-the-fly reseeding: A new reseeding technique for test-per-clock BIST | Kalligeros, E.; Kavousianos, X.; Bakalis, D.; Nikolos, D. | 24-Nov-2015 | - |
| Optimal selective Huffman coding for test-data compression | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Placement and Routing in Computer Aided Design of Standard Cell Arrays by Exploiting the Structure of the Interconnection Graph | Kavousianos, X.; Fudos, I. | 24-Nov-2015 | - |
| Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores | Tenentes, V.; Kavousianos, X.; Kalligeros, E. | 24-Nov-2015 | - |
| Static Power Reduction Using Variation-Tolerant and Reconfigurable Multi-Mode Power Switches | Zhang, Z.; Kavousianos, X.; Chakrabarty, K.; Tsiatouhas, Y. | 24-Nov-2015 | - |
| Test data compression based on variable-to-variable Huffman encoding with codeword reusability | Kavousianos, X.; Kalligeros, E.; Nikolos, D. | 24-Nov-2015 | - |
| Test Schedule Optimization for Multicore SoCs: Handling Dynamic Voltage Scaling and Multiple Voltage Islands | Kavousianos, X.; Chakrabarty, K.; Jain, A.; Parekhji, R. | 24-Nov-2015 | - |
| Timing error detection and correction by time dilation | Floros, A.; Tsiatouhas, Y.; Kavousianos, X. | 11-Dec-2015 | - |
