Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/10981
Title: | Test data compression based on variable-to-variable Huffman encoding with codeword reusability |
Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
Keywords: | embedded testing techniques,huffman encoding,intellectual property (ip) cores,test data compression,a-chip test,pattern generation,power,circuits,reduction,volume,codes |
URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/10981 |
ISSN: | 0278-0070 |
Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
File | Description | Size | Format | |
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Kavousianos-2008-Test data compressio.pdf | 429.71 kB | Adobe PDF | View/Open Request a copy |
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