Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/10981| Title: | Test data compression based on variable-to-variable Huffman encoding with codeword reusability |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | embedded testing techniques,huffman encoding,intellectual property (ip) cores,test data compression,a-chip test,pattern generation,power,circuits,reduction,volume,codes |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/10981 |
| ISSN: | 0278-0070 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2008-Test data compressio.pdf | 429.71 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
