Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/10981Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kavousianos, X. | en |
| dc.contributor.author | Kalligeros, E. | en |
| dc.contributor.author | Nikolos, D. | en |
| dc.date.accessioned | 2015-11-24T17:01:48Z | - |
| dc.date.available | 2015-11-24T17:01:48Z | - |
| dc.identifier.issn | 0278-0070 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/10981 | - |
| dc.rights | Default Licence | - |
| dc.subject | embedded testing techniques | en |
| dc.subject | huffman encoding | en |
| dc.subject | intellectual property (ip) cores | en |
| dc.subject | test data compression | en |
| dc.subject | a-chip test | en |
| dc.subject | pattern generation | en |
| dc.subject | power | en |
| dc.subject | circuits | en |
| dc.subject | reduction | en |
| dc.subject | volume | en |
| dc.subject | codes | en |
| dc.title | Test data compression based on variable-to-variable Huffman encoding with codeword reusability | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | Doi 10.1109/Tcad.2008.923100 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.publicationDate | 2008 | - |
| heal.abstract | A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed. | en |
| heal.journalName | Ieee Transactions on Computer-Aided Design of Integrated Circuits and Systems | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2008-Test data compressio.pdf | 429.71 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
