Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11069| Title: | Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | defect-oriented testing,dynamic reseeding,embedded testing,linear decompressors,static reseeding |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11069 |
| ISSN: | 1063-8210 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2011-Defect-Oriented LFSR.pdf | 359.59 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
