Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11069
Title: | Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets |
Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
Keywords: | defect-oriented testing,dynamic reseeding,embedded testing,linear decompressors,static reseeding |
URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11069 |
ISSN: | 1063-8210 |
Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
File | Description | Size | Format | |
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Kavousianos-2011-Defect-Oriented LFSR.pdf | 359.59 kB | Adobe PDF | View/Open Request a copy |
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