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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kavousianos, X. | en |
| dc.contributor.author | Tenentes, V. | en |
| dc.contributor.author | Chakrabarty, K. | en |
| dc.contributor.author | Kalligeros, E. | en |
| dc.date.accessioned | 2015-11-24T17:02:34Z | - |
| dc.date.available | 2015-11-24T17:02:34Z | - |
| dc.identifier.issn | 1063-8210 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/11069 | - |
| dc.rights | Default Licence | - |
| dc.subject | defect-oriented testing | en |
| dc.subject | dynamic reseeding | en |
| dc.subject | embedded testing | en |
| dc.subject | linear decompressors | en |
| dc.subject | static reseeding | en |
| dc.title | Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | Doi 10.1109/Tvlsi.2010.2079961 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.publicationDate | 2011 | - |
| heal.abstract | Defect screening is a major challenge for nanoscale CMOS circuits, especially since many defects cannot be accurately modeled using known fault models. The effectiveness of test methods for such circuits can therefore be measured in terms of the coverage obtained for unmodeled faults. In this paper, we present a new defect-oriented dynamic LFSR reseeding technique for test-data compression. The proposed technique is based on a new output-deviation metric for grading stuck-at patterns derived from LFSR seeds. We show that, compared to standard compression-driven dynamic LFSR reseeding and a previously proposed deviation-based method, higher defect coverage is obtained using stuck-at test cubes without any loss of compression. | en |
| heal.journalName | Ieee Transactions on Very Large Scale Integration (Vlsi) Systems | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2011-Defect-Oriented LFSR.pdf | 359.59 kB | Adobe PDF | View/Open Request a copy |
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