Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11010| Title: | Efficient Partial Scan Cell Gating for Low-Power Scan-Based Testing |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | algorithms,design,reliability,low-power testing,scan-based testing,scan cell gating,partial gating,circuits,cores |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11010 |
| ISSN: | 1084-4309 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2009-Efficient Partial Sc.pdf | 275.49 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
