Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11068| Title: | Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | defect-oriented testing,multi-detect testing,test patterns,integrated-circuits,quality,processor |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11068 |
| ISSN: | 0278-0070 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2011-Generation of Compac.pdf | 336.36 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
