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https://olympias.lib.uoi.gr/jspui/handle/123456789/11068Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kavousianos, X. | en |
| dc.contributor.author | Chakrabarty, K. | en |
| dc.date.accessioned | 2015-11-24T17:02:34Z | - |
| dc.date.available | 2015-11-24T17:02:34Z | - |
| dc.identifier.issn | 0278-0070 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/11068 | - |
| dc.rights | Default Licence | - |
| dc.subject | defect-oriented testing | en |
| dc.subject | multi-detect testing | en |
| dc.subject | test patterns | en |
| dc.subject | integrated-circuits | en |
| dc.subject | quality | en |
| dc.subject | processor | en |
| dc.title | Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | Doi 10.1109/Tcad.2010.2101750 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.publicationDate | 2011 | - |
| heal.abstract | This letter presents a new method to generate compact stuck-at test sets that offer high defect coverage. The proposed method first selects the most effective patterns from a large N-detect repository, by using a new output deviation-based metric. Then it embeds complete coverage of stuck-at faults within these patterns, and uses the proposed metric to further improve their defect coverage. Results show that the proposed method outperforms a recently proposed competing approach in terms of unmodeled defect coverage. In many cases, higher defect coverage is obtained even than much larger N-detect test sets for several values of N. Finally, results provide the insight that, instead of using N-detect testing with as large N as possible, it is more efficient to combine the output deviations metric with multi-detect testing to get high-quality, compact test sets. | en |
| heal.journalName | Ieee Transactions on Computer-Aided Design of Integrated Circuits and Systems | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kavousianos-2011-Generation of Compac.pdf | 336.36 kB | Adobe PDF | View/Open Request a copy |
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