Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11068
Title: | Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects |
Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
Keywords: | defect-oriented testing,multi-detect testing,test patterns,integrated-circuits,quality,processor |
URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11068 |
ISSN: | 0278-0070 |
Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
File | Description | Size | Format | |
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Kavousianos-2011-Generation of Compac.pdf | 336.36 kB | Adobe PDF | View/Open Request a copy |
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