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Author
5
Dimitriadis, C. A.
3
Charitidis, C.
2
Brini, J.
2
Kamarinos, G.
2
Lee, J. I.
2
Tassis, D. H.
1
Aslanoglou, X. A.
1
Evangelou, E. K.
1
Gautier, S.
1
Groetschel, R.
.
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Subject
6
contacts
3
thin-films
2
1/f noise
2
barrier diodes
2
grain growth
2
metal
2
nitride thin-films
2
optical properties
2
silicon
2
tin
.
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Date
7
2000 - 2010
3
1998 - 1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Επιστήμης Υλικών
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions (Journal article)
In situ and real-time ellipsometry monitoring of submicron titanium nitride/titanium silicide electronic devices (Journal article)
The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films (Journal article)
In-situ monitoring of the electronic properties and growth evolution of TiN films (Journal article)
Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering (Journal article)
Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices (Journal article)
Electronic properties of binary and ternary, hard and refractory transition metal nitrides (Journal article)
Oxidation and structural changes in fcc TiNx thin films studied with X-ray reflectivity (Journal article)
Optical and electrical properties of TiN/n-GaN contacts in correlation with their structural properties (Journal article)
Low frequency noise measurements on TiN/n-Si Schottky diodes (Journal article)