Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14320| Title: | Oxidation and structural changes in fcc TiNx thin films studied with X-ray reflectivity |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | tin,x-ray reflectivity,oxidation,magnetron sputtering,titanium nitride |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14320 |
| ISSN: | 0257-8972 |
| Link: | <Go to ISI>://000073638700058 |
| Publisher: | Elsevier |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-1998-Oxidation and structural changes.pdf | 454.31 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
