Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14123| Title: | Low frequency noise measurements on TiN/n-Si Schottky diodes |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | schottky barriers,low frequency noise,random walk of electrons,reactive magnetron sputtering,deposition temperature,titanium nitride,thin-films,barrier diodes,1/f noise,silicon,contacts,metal |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14123 |
| ISSN: | 0169-4332 |
| Link: | <Go to ISI>://000080163900076 |
| Publisher: | Elsevier |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-1999-Low frequency noise.pdf | 54.56 kB | Adobe PDF | View/Open Request a copy |
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