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Author
8
Kavousianos, X.
6
Nikolos, D.
2
Tenentes, V.
1
Bakalis, D.
1
Chakrabarty, K.
Subject
4
a-chip test
4
circuits
3
codes
3
embedded testing techniques
3
huffman encoding
3
pattern generation
3
power
2
built-in-test
2
intellectual property (ip) cores
2
linear feedback shift registers (...
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journalArticle
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2011
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
Άρθρα σε επιστημονικά περιοδικά (Κλειστά)
Διατριβές Μεταπτυχιακής Έρευνας (Masters) - ΜΥ
Διδακτορικές Διατριβές
Μονογραφίες ( Ανοικτές)
Μονογραφίες ( Κλειστές)
Ομιλίες σε Συνέδριο
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Single and Variable-State-Skip LFSRs: Bridging the Gap Between Test Data Compression and Test Set Embedding for IP Cores (Journal article)
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets (Journal article)
Multilevel Huffman coding: An efficient test-data compression method for IP cores (Journal article)
Multilevel-Huffman test-data compression for IP cores with multiple scan chains (Journal article)
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST (Journal article)
Test data compression based on variable-to-variable Huffman encoding with codeword reusability (Journal article)
Optimal selective Huffman coding for test-data compression (Journal article)
Multiphase BIST: A new reseeding technique for high test-data compression (Journal article)