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Author
11
Patsalas, P.
10
Logothetidis, S.
5
Dimitriadis, C. A.
3
Charitidis, C.
2
Brini, J.
2
Kamarinos, G.
2
Koutsokeras, L. E.
2
Lee, J. I.
2
Tassis, D. H.
1
Aslanoglou, X. A.
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6
contacts
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thin-films
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1/f noise
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barrier diodes
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grain growth
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metal
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microstructure
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nitride thin-films
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optical properties
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silicon
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11
journalArticle
Date
2
2010 - 2013
6
2000 - 2009
3
1998 - 1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Επιστήμης Υλικών
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Structure, electronic properties and electron energy loss spectra of transition metal nitride films (Journal article)
Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions (Journal article)
In situ and real-time ellipsometry monitoring of submicron titanium nitride/titanium silicide electronic devices (Journal article)
The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films (Journal article)
In-situ monitoring of the electronic properties and growth evolution of TiN films (Journal article)
Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering (Journal article)
Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devices (Journal article)
Electronic properties of binary and ternary, hard and refractory transition metal nitrides (Journal article)
Oxidation and structural changes in fcc TiNx thin films studied with X-ray reflectivity (Journal article)
Optical and electrical properties of TiN/n-GaN contacts in correlation with their structural properties (Journal article)