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Author
10
Nikolos, D.
6
Kalligeros, E.
4
Bakalis, D.
1
Alexiou, G. P.
1
Fudos, I.
1
Sidiropoulos, G.
1
Tragoudas, S.
1
Vergos, H. T.
Subject
5
circuits
4
a-chip test
3
built-in self-test
3
codes
3
embedded testing techniques
3
huffman encoding
3
pattern generation
3
power
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bist
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built-in-test
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11
journalArticle
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2009
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
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Results 1-10 of 11 (Search time: 0.111 seconds).
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Novel single and double output TSC CMOS checkers for m-out-of-n codes (Journal article)
Efficient Partial Scan Cell Gating for Low-Power Scan-Based Testing (Journal article)
Multilevel Huffman coding: An efficient test-data compression method for IP cores (Journal article)
Multilevel-Huffman test-data compression for IP cores with multiple scan chains (Journal article)
Low power built-in self-test schemes for array and booth multipliers (Journal article)
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST (Journal article)
A new built-in TPG method for circuits with random pattern resistant faults (Journal article)
Test data compression based on variable-to-variable Huffman encoding with codeword reusability (Journal article)
Optimal selective Huffman coding for test-data compression (Journal article)
Placement and Routing in Computer Aided Design of Standard Cell Arrays by Exploiting the Structure of the Interconnection Graph (Journal article)