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Repository of UOI "Olympias"
Repository of OAI
Browsing by Author Rahman, M. S.
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Showing results 1 to 7 of 7
Title
Author(s)
Issue date
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Anomalous charge trapping dynamics in cerium oxide grown on germanium substrate
Rahman, M. S.
;
Evangelou, E. K.
;
Dimoulas, A.
;
Mavrou, G.
;
Galata, S.
24-Nov-2015
-
Current instabilities in rare-earth oxides-HfO(2) gate stacks grown on germanium based metal-oxide-semiconductor devices due to Maxwell-Wagner instabilities and dielectrics relaxation
Rahman, M. S.
;
Evangelou, E. K.
;
Dimoulas, A.
;
Mavrou, G.
;
Galata, S.
24-Nov-2015
-
Current Transport Mechanism in High-kappa Cerium Oxide Gate Dielectrics Grown on Germanium Substrates
Rahman, M. S.
;
Evangelou, E. K.
;
Androulidakis, I. I.
;
Dimoulas, A.
24-Nov-2015
-
Investigation of voltage dependent relaxation, charge trapping, and stress induced leakage current effects in HfO(2)/Dy(2)O(3) gate stacks grown on Ge (100) substrates
Rahman, M. S.
;
Evangelou, E. K.
;
Androulidakis, I. I.
;
Dimoulas, A.
;
Mavrou, G.
;
Tsipas, P.
24-Nov-2015
-
SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stress
Rahman, M. S.
;
Evangelou, E. K.
;
Androulidakis, I. I.
;
Dimoulas, A.
;
Mavrou, G.
;
Galata, S.
24-Nov-2015
-
Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substrates
Evangelou, E. K.
;
Rahman, M. S.
;
Androulidakis, I. I.
;
Dimoulas, A.
;
Mavrou, G.
;
Giannakopoulos, K. P.
;
Anagnostopoulos, D. F.
;
Valicu, R.
;
Borchert, G. L.
24-Nov-2015
-
Study of stress-induced leakage current (SILC) in HfO(2)/Dy(2)O(3) high-kappa gate stacks on germanium
Rahman, M. S.
;
Evangelou, E. K.
;
Androulidakis, I. I.
;
Dimoulas, A.
24-Nov-2015
-