Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/16412| Title: | Current Transport Mechanism in High-kappa Cerium Oxide Gate Dielectrics Grown on Germanium Substrates |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών |
| Keywords: | cerium compounds,germanium,high-k dielectric thin films,mis devices,mis structures,platinum,poole-frenkel effect,schottky barriers,devices,films |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/16412 |
| ISSN: | 1099-0062 |
| Link: | <Go to ISI>://000264283100022 http://scitation.aip.org/getabs/servlet/GetabsServlet?prog=normal&id=ESLEF600001200000500H165000001&idtype=cvips&gifs=yes&ref=no |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
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