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Repository of UOI "Olympias"
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Browsing by Author Mavrou, G.
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Showing results 3 to 8 of 8
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Electrical properties of La(2)O(3) and HfO(2)/La(2)O(3) gate dielectrics for germanium metal-oxide-semiconductor devices
Mavrou, G.
;
Galata, S.
;
Tsipas, P.
;
Sotiropoulos, A.
;
Panayiotatos, Y.
;
Dirnoulas, A.
;
Evangelou, E. K.
;
Seo, J. W.
;
Dieker, C.
24-Nov-2015
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Germanium metal-insulator-semiconductor capacitors with rare earth La2O3 gate dielectric
Mavrou, G.
;
Galata, S. F.
;
Sotiropoulos, A.
;
Tsipas, P.
;
Panayiotatos, Y.
;
Dimoulas, A.
;
Evangelou, E. K.
;
Seo, J. W.
;
Dieker, C.
24-Nov-2015
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Investigation of voltage dependent relaxation, charge trapping, and stress induced leakage current effects in HfO(2)/Dy(2)O(3) gate stacks grown on Ge (100) substrates
Rahman, M. S.
;
Evangelou, E. K.
;
Androulidakis, I. I.
;
Dimoulas, A.
;
Mavrou, G.
;
Tsipas, P.
24-Nov-2015
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Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd(2)O(3)/Ge capacitors
Evangelou, E. K.
;
Mavrou, G.
;
DimoulaS, A.
;
Konofaos, N.
24-Nov-2015
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SILC decay in La(2)O(3) gate dielectrics grown on Ge substrates subjected to constant voltage stress
Rahman, M. S.
;
Evangelou, E. K.
;
Androulidakis, I. I.
;
Dimoulas, A.
;
Mavrou, G.
;
Galata, S.
24-Nov-2015
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Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substrates
Evangelou, E. K.
;
Rahman, M. S.
;
Androulidakis, I. I.
;
Dimoulas, A.
;
Mavrou, G.
;
Giannakopoulos, K. P.
;
Anagnostopoulos, D. F.
;
Valicu, R.
;
Borchert, G. L.
24-Nov-2015
-