Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/17271
Institution and School/Department of submitter: Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών
Keywords: germanium,rare earth oxides,nibe,electrical properties,interface states,bulk states,atomic-layer deposition,gate dielectrics,beam deposition,ge(100),si,si(100)
URI: https://olympias.lib.uoi.gr/jspui/handle/123456789/17271
ISSN: 0038-1101
Link: <Go to ISI>://000247900700023
http://ac.els-cdn.com/S003811010600342X/1-s2.0-S003811010600342X-main.pdf?_tid=eb6eaee8d316fecf2a8c148e75be5fde&acdnat=1334219937_c37cbba1ca677e0f6a50cedf5c078d4a
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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