Browsing by Author Konofaos, N.

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Showing results 1 to 11 of 11
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Characterization of BaTiO3 thin films on p-SiEvangelou, E. K.; Konofaos, N.; Aslanoglou, X.; Kennou, S.; Thomas, C. B.24-Nov-2015-
Characterization of BaTiO3 thin films on p-SiEvangelou, E. K.; Konofaos, N.; Aslanoglou, X.; Kennou, S.; Thomas, C. B.24-Nov-2015-
Characterization of magnetron sputtering deposited thin films of TiN for use as a metal electrode on TiN/SiO2/Si metal-oxide-semiconductor devicesEvangelou, E. K.; Konofaos, N.; Aslanoglou, X. A.; Dimitriadis, C. A.; Patsalas, P.; Logothetidis, S.; Kokkoris, M.; Kossionides, E.; Vlastou, R.; Groetschel, R.24-Nov-2015-
Device characterization for amorphous diamond-like carbon-silicon heterojunctionsKonofaos, N.; Evangelou, E.; Thomas, C. B.24-Nov-2015-
Dielectric properties and electronic transitions of porous and nanostructured cerium oxide filmsLogothetidis, S.; Patsalas, P.; Evangelou, E. K.; Konofaos, N.; Tsiaoussis, I.; Frangis, N.24-Nov-2015-
Dielectric properties of CVD grown SiON thin films on Si for MOS microelectronic devicesKonofaos, N.; Evangelou, E. K.; Aslanoglou, X.; Kokkoris, M.; Vlastou, R.24-Nov-2015-
Effect of the layered structure on the electronic properties of amorphous carbon films on n-SiKonofaos, N.; Evangelou, E.; Logothetidis, S.24-Nov-2015-
Electrical behaviour of metal/a-C/Si and metal/CN/Si devicesEvangelou, E.; Konofaos, N.; Logothetidis, S.; Gioti, M.24-Nov-2015-
Nitrogen induced states at the CNx/Si interfaceEvangelou, E.; Konofaos, N.; Gioti, M.; Logothetidis, S.24-Nov-2015-
Properties and density of states of the interface between silicon and carbon films rich in sp(3) bondsLogothetidis, S.; Evangelou, E.; Konofaos, N.24-Nov-2015-
Rare earth oxides as high-k dielectrics for Ge based MOS devices: An electrical study of Pt/Gd(2)O(3)/Ge capacitorsEvangelou, E. K.; Mavrou, G.; DimoulaS, A.; Konofaos, N.24-Nov-2015-