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Author
8
Gioti, M.
6
Charitidis, C.
3
Kalfagiannis, N.
2
Brini, J.
2
Dimitriadis, C. A.
2
Kamarinos, G.
2
Karagiannidis, P. G.
2
Kassavetis, S.
2
Kehagias, T.
2
Kennou, S.
.
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Subject
7
spectroscopic ellipsometry
6
ellipsometry
5
amorphous carbon
5
diamond
5
optical-properties
4
density
3
coatings
3
deposition
3
silicon
3
sputtering
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Date
2
2010 - 2012
13
2000 - 2009
5
1999 - 1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Επιστήμης Υλικών
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Stability, enhancement of elastic properties and structure of multilayered amorphous carbon films (Journal article)
A complementary study of bonding and electronic structure of amorphous carbon films by electron spectroscopy and optical techniques (Journal article)
The effect of postgrowth ion irradiation on the microstructure and the interface properties of amorphous carbon films on silicon (Journal article)
The kinetics of sputtered deposited carbon on silicon: a phenomenological model (Journal article)
In-situ monitoring of the electronic properties and growth evolution of TiN films (Journal article)
Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering (Journal article)
Crystalline structures of carbon complexes in amorphous carbon films (Journal article)
Dispersion relations and optical properties of amorphous carbons (Journal article)
Development of diamond and diamond-related materials with desired properties (Journal article)
Investigation of bilayer period and individual layer thickness of CrN/TiN superlattices by ellipsometry and X-ray techniques (Journal article)