Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/16598| Title: | Beam characterization of the Orsay He-afterflow polarized electron source |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/16598 |
| ISSN: | 0022-3727 |
| Link: | http://stacks.iop.org/0022-3727/30/i=3/a=014 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) - ΦΥΣ |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| cohen-1997-Beam characterization of the Orsay He-afterflow polarized electron source.pdf | 112.3 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
