Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/16598
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dc.contributor.authorSamuel, Cohenen
dc.contributor.authorOuasilla, Zerhounien
dc.contributor.authorJ?el, Arianeren
dc.contributor.authorSaid, Essabaaen
dc.contributor.authorRobert, Frascariaen
dc.date.accessioned2015-11-24T18:32:41Z-
dc.date.available2015-11-24T18:32:41Z-
dc.identifier.issn0022-3727-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/16598-
dc.rightsDefault Licence-
dc.titleBeam characterization of the Orsay He-afterflow polarized electron sourceen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.secondaryhttp://stacks.iop.org/0022-3727/30/i=3/a=014-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιώνel
heal.publicationDate1997-
heal.abstractThe measured optical properties of the Orsay polarized electron source, based on the ##IMG## [http://ej.iop.org/images/0022-3727/30/3/014/img1.gif] Penning ionization reaction are presented. The upper limit on the beam energy spread is 0.25 eV, corresponding to our experimental resolution. The highest normalized emittance obtained at low current ##IMG## [http://ej.iop.org/images/0022-3727/30/3/014/img2.gif] is ##IMG## [http://ej.iop.org/images/0022-3727/30/3/014/img3.gif] . The behaviour of these beam characteristics as a function of different relevant parameters is discussed.en
heal.journalNameJournal of Physics D: Applied Physicsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) - ΦΥΣ



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