Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/13429
Title: Preliminary test and Stein-type estimation of location parameter for elliptically contoured distributions.
Institution and School/Department of submitter: Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μαθηματικών
URI: https://olympias.lib.uoi.gr/jspui/handle/123456789/13429
ISSN: 0972-3617
Publisher: Pushpa Publishing House
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά). ΜΑΘ

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