Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/13429
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMen?ndez, M. L.en
dc.contributor.authorPardo, L.en
dc.contributor.authorZografos, K.en
dc.date.accessioned2015-11-24T17:27:41Z-
dc.date.available2015-11-24T17:27:41Z-
dc.identifier.issn0972-3617-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/13429-
dc.rightsDefault Licence-
dc.titlePreliminary test and Stein-type estimation of location parameter for elliptically contoured distributions.en
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μαθηματικώνel
heal.publicationDate2009-
heal.publisherPushpa Publishing Houseen
heal.journalNameAdvances and Applications in Statisticsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά). ΜΑΘ

Files in This Item:
File Description SizeFormat 
Zografos-2009-Preliminary test and Stein-type.pdf301.1 kBAdobe PDFView/Open    Request a copy


This item is licensed under a Creative Commons License Creative Commons