Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/1246| Title: | Reliability issues and electrical characteristics of rare-earth oxides and their gate stacks grown on germanium substrates |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Φυσικής |
| Subject classification: | - |
| Keywords: | - |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/1246 http://dx.doi.org/10.26268/heal.uoi.1402 |
| Link: | Δ.Δ. RAH 2009 |
| Appears in Collections: | Διδακτορικές Διατριβές - ΦΥΣ |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Δ.Δ. - SHAHINUR RAHMAN.pdf | 6.2 MB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License
