Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/1246Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shahinur, Rahman | en |
| dc.date.accessioned | 2015-10-22T10:11:19Z | - |
| dc.date.available | 2015-10-22T10:11:19Z | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/1246 | - |
| dc.identifier.uri | http://dx.doi.org/10.26268/heal.uoi.1402 | - |
| dc.rights | Default License | - |
| dc.subject | - | |
| dc.title | Reliability issues and electrical characteristics of rare-earth oxides and their gate stacks grown on germanium substrates | el |
| heal.type | doctoralThesis | - |
| heal.type.en | Doctoral thesis | en |
| heal.type.el | Διδακτορική διατριβή | el |
| heal.classification | - | |
| heal.identifier.secondary | Δ.Δ. RAH 2009 | - |
| heal.language | en | - |
| heal.access | free | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Φυσικής | |
| heal.publicationDate | 2009 | - |
| heal.bibliographicCitation | Βιβλιογραφία: σ. 214 | el |
| heal.advisorName | Evangelou, E. | el |
| heal.committeeMemberName | Floudas, G. | en |
| heal.committeeMemberName | Dimoulas, A. | en |
| heal.committeeMemberName | Kamaratos, M. | en |
| heal.committeeMemberName | Kontiras, Chr. | en |
| heal.committeeMemberName | Konofaos, N. | en |
| heal.committeeMemberName | Patsalas, Pan. | en |
| heal.academicPublisher | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Φυσική | el |
| heal.academicPublisherID | uoi | - |
| heal.numberOfPages | 221 σ. | - |
| heal.fullTextAvailability | true | - |
| Appears in Collections: | Διδακτορικές Διατριβές - ΦΥΣ | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Δ.Δ. - SHAHINUR RAHMAN.pdf | 6.2 MB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License
