Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11037| Title: | Initialization-Based Test Pattern Generation for Asynchronous Circuits |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | asynchronous circuits,automatic test pattern generation (atpg),sequential initialization,stuck-at fault testing,sequential-circuits,testability |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11037 |
| ISSN: | 1063-8210 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Efthymiou-2010-Initialization-Based.pdf | 347.63 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
