Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/11037
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dc.contributor.authorEfthymiou, A.en
dc.date.accessioned2015-11-24T17:02:18Z-
dc.date.available2015-11-24T17:02:18Z-
dc.identifier.issn1063-8210-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/11037-
dc.rightsDefault Licence-
dc.subjectasynchronous circuitsen
dc.subjectautomatic test pattern generation (atpg)en
dc.subjectsequential initializationen
dc.subjectstuck-at fault testingen
dc.subjectsequential-circuitsen
dc.subjecttestabilityen
dc.titleInitialization-Based Test Pattern Generation for Asynchronous Circuitsen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.primaryDoi 10.1109/Tvlsi.2009.2013470-
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικήςel
heal.publicationDate2010-
heal.abstractA novel test pattern generation method for asynchronous circuits is described and evaluated in detail. The method combines conventional pattern generation with hazard-free state initialization. Any type of asynchronous circuit can be processed, and all stuck-at faults, even those inside state-holding elements, such as C-elements, are considered. The results on some of the largest benchmarks ever used for asynchronous circuit testing show fault coverage on the order of 99% with no area overhead for (quasi-) delay-insensitive datapath circuits.en
heal.journalNameIeee Transactions on Very Large Scale Integration (Vlsi) Systemsen
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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