Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/11036| Title: | A Built-In-Test Circuit for RF Differential Low Noise Amplifiers |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής |
| Keywords: | built-in-test (bit),design for testability,lna testing,rf testing,triple modular redundancy,low-cost test,self-test,analog |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/11036 |
| ISSN: | 1549-8328 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| tsiatouhas-2010-A Built-In-Test Circuit for RF Differential Low Noise Amplifiers.pdf | 1.83 MB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
