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https://olympias.lib.uoi.gr/jspui/handle/123456789/11036Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Dermentzoglou, L. E. | en |
| dc.contributor.author | Arapoyanni, A. | en |
| dc.contributor.author | Tsiatouhas, Y. | en |
| dc.date.accessioned | 2015-11-24T17:02:17Z | - |
| dc.date.available | 2015-11-24T17:02:17Z | - |
| dc.identifier.issn | 1549-8328 | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/11036 | - |
| dc.rights | Default Licence | - |
| dc.subject | built-in-test (bit) | en |
| dc.subject | design for testability | en |
| dc.subject | lna testing | en |
| dc.subject | rf testing | en |
| dc.subject | triple modular redundancy | en |
| dc.subject | low-cost test | en |
| dc.subject | self-test | en |
| dc.subject | analog | en |
| dc.title | A Built-In-Test Circuit for RF Differential Low Noise Amplifiers | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | Doi 10.1109/Tcsi.2009.2035417 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής | el |
| heal.publicationDate | 2010 | - |
| heal.abstract | This paper presents an efficient, low-cost, built-in test (BIT) circuit for radio frequency differential low noise amplifiers (DLNAs). The BIT circuit detects amplitude alterations at the outputs of the DLNA, due to parametric or catastrophic faults, and provides a single digital Pass/Fail indication signal. A triple modular redundancy approach has been adopted for the BIT circuit design to avoid possible yield loss in case of a malfunctioning test circuitry. The technique has been evaluated on a typical CMOS RF DLNA and simulation results are presented. | en |
| heal.journalName | Ieee Transactions on Circuits and Systems I-Regular Papers | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| tsiatouhas-2010-A Built-In-Test Circuit for RF Differential Low Noise Amplifiers.pdf | 1.83 MB | Adobe PDF | View/Open Request a copy |
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