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Author
47
Patsalas, P.
14
Charitidis, C.
12
Gioti, M.
7
Dimitriadis, C. A.
6
Panayiotatos, Y.
4
Gravalidis, C.
4
Kennou, S.
3
Kalfagiannis, N.
3
Kassavetis, S.
3
Kehagias, T.
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thin-films
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spectroscopic ellipsometry
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diamond
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titanium nitride
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ellipsometry
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optical-properties
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amorphous carbon
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contacts
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47
journalArticle
Date
3
2010 - 2012
35
2000 - 2009
9
1998 - 1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Επιστήμης Υλικών
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Surface kinetics and subplantation phenomena affecting the texture, morphology, stress, and growth evolution of titanium nitride films (Journal article)
Surface-activation processes and ion-solid interactions during the nucleation and growth of ultra-thin amorphous carbon films (Journal article)
Stability, enhancement of elastic properties and structure of multilayered amorphous carbon films (Journal article)
Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions (Journal article)
Surface and interface morphology and structure of amorphous carbon thin and multilayer films (Journal article)
Structure-dependent electronic properties of nanocrystalline cerium oxide films (Journal article)
In situ and real-time ellipsometry monitoring of submicron titanium nitride/titanium silicide electronic devices (Journal article)
A new process for the development of hard and stable sputtered amorphous carbon films (Journal article)
A complementary study of bonding and electronic structure of amorphous carbon films by electron spectroscopy and optical techniques (Journal article)
The effect of crystal structure and morphology on the optical properties of chromium nitride thin films (Journal article)