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Author
9
Charitidis, C.
8
Gioti, M.
6
Panayiotatos, Y.
4
Dimitriadis, C. A.
4
Kennou, S.
3
Gravalidis, C.
3
Kelires, P. C.
2
Evangelou, E. K.
2
Handrea, M.
2
Hastas, N. A.
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13
thin-films
12
spectroscopic ellipsometry
6
amorphous carbon
6
density
6
diamond
6
optical-properties
6
titanium nitride
5
ellipsometry
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sputtering
4
amorphous-carbon films
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35
journalArticle
Date
1
2007
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2003
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Επιστήμης Υλικών
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Surface kinetics and subplantation phenomena affecting the texture, morphology, stress, and growth evolution of titanium nitride films (Journal article)
Surface-activation processes and ion-solid interactions during the nucleation and growth of ultra-thin amorphous carbon films (Journal article)
Structural, electrical, and low-frequency-noise properties of amorphous-carbon-silicon heterojunctions (Journal article)
Surface and interface morphology and structure of amorphous carbon thin and multilayer films (Journal article)
Structure-dependent electronic properties of nanocrystalline cerium oxide films (Journal article)
In situ and real-time ellipsometry monitoring of submicron titanium nitride/titanium silicide electronic devices (Journal article)
A complementary study of bonding and electronic structure of amorphous carbon films by electron spectroscopy and optical techniques (Journal article)
The effect of crystal structure and morphology on the optical properties of chromium nitride thin films (Journal article)
The effect of postgrowth ion irradiation on the microstructure and the interface properties of amorphous carbon films on silicon (Journal article)
The effect of substrate temperature and biasing on the mechanical properties and structure of sputtered titanium nitride thin films (Journal article)