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Repository of UOI "Olympias"
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Author
2
Chakrabarty, K.
2
Kavousianos, X.
1
Kalligeros, E.
1
Tenentes, V.
Subject
1
dynamic reseeding
1
embedded testing
1
integrated-circuits
1
linear decompressors
1
multi-detect testing
1
processor
1
quality
1
static reseeding
1
test patterns
Item Type
2
journalArticle
Date
2
2011
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
Άρθρα σε επιστημονικά περιοδικά (Κλειστά)
Διατριβές Μεταπτυχιακής Έρευνας (Masters) - ΜΥ
Διδακτορικές Διατριβές
Μονογραφίες ( Ανοικτές)
Μονογραφίες ( Κλειστές)
Ομιλίες σε Συνέδριο
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Generation of Compact Stuck-At Test Sets Targeting Unmodeled Defects (Journal article)
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets (Journal article)