Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/16377
Title: Determination of bulk etch rate for CR-39 nuclear track detectors using an X-ray fluorescence method
Institution and School/Department of submitter: Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών
Keywords: edxrf,mass absorption coefficient,detector thickness,cr-39,bulk etch rate,mass-change method,atomic-force microscope,epoxy-resin,spectrometry,thicknesses,temperature,technology,science,state
URI: https://olympias.lib.uoi.gr/jspui/handle/123456789/16377
ISSN: 0168-583X
Link: <Go to ISI>://000251737300025
http://ac.els-cdn.com/S0168583X07013559/1-s2.0-S0168583X07013559-main.pdf?_tid=7f16534b7b881b7248846ef73285f707&acdnat=1334223178_7ba0183b89af245437a27175166016b6
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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