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https://olympias.lib.uoi.gr/jspui/handle/123456789/16377Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Papachristodoulou, C. | en |
| dc.contributor.author | Patiris, D. | en |
| dc.contributor.author | Ioannides, K. G. | en |
| dc.date.accessioned | 2015-11-24T18:30:31Z | - |
| dc.date.available | 2015-11-24T18:30:31Z | - |
| dc.identifier.issn | 0168-583X | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/16377 | - |
| dc.rights | Default Licence | - |
| dc.subject | edxrf | en |
| dc.subject | mass absorption coefficient | en |
| dc.subject | detector thickness | en |
| dc.subject | cr-39 | en |
| dc.subject | bulk etch rate | en |
| dc.subject | mass-change method | en |
| dc.subject | atomic-force microscope | en |
| dc.subject | epoxy-resin | en |
| dc.subject | spectrometry | en |
| dc.subject | thicknesses | en |
| dc.subject | temperature | en |
| dc.subject | technology | en |
| dc.subject | science | en |
| dc.subject | state | en |
| dc.title | Determination of bulk etch rate for CR-39 nuclear track detectors using an X-ray fluorescence method | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | DOI 10.1016/j.nimb.2007.08.005 | - |
| heal.identifier.secondary | <Go to ISI>://000251737300025 | - |
| heal.identifier.secondary | http://ac.els-cdn.com/S0168583X07013559/1-s2.0-S0168583X07013559-main.pdf?_tid=7f16534b7b881b7248846ef73285f707&acdnat=1334223178_7ba0183b89af245437a27175166016b6 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών | el |
| heal.publicationDate | 2007 | - |
| heal.abstract | The thickness of a CR-39 detector is determined using an energy dispersive X-ray fluorescence (EDXRF) method of analysis. The method is based on exciting a suitable target and measuring the intensity of its fluorescence X-ray lines passing through the CR-39 sample in a fixed geometry. By properly selecting the target material, the method succeeds in assessing the thickness change of CR-39 detectors etched for different time intervals. The bulk etch rate (V-b) may thus be obtained, which is an important parameter for any solid state nuclear track detector. Application of the EDXRF method yielded a value of V-b = (2.01 +/- 0.04) mu m h(-1) for etching in a 6 N NaOH solution at 75 degrees C. This value agrees with the bulk etch rate of (1.90 +/- 0.03) mu m h(-1), obtained by the conventional mass-change method. (C) 2007 Elsevier B.V. All rights reserved. | en |
| heal.journalName | Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms | en |
| heal.journalType | peer reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Papachristodoulou-2007-Determination of bul.pdf | 305.61 kB | Adobe PDF | View/Open Request a copy |
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