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dc.contributor.authorKotsis Κ.Τ.en
dc.contributor.authorAlexandropoulos Ν.G.en
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dc.titleΑ source of spurious peaks in α mυlti crystal Χ-ray spectrometeren
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών Αγωγής. Παιδαγωγικό Τμήμα Δημοτικής Εκπαίδευσηςel
heal.abstractWe demonstrate that, under certain conditions, the spectrum of a monochromatic x-ray beam analysed by a multicrystal spectrometer includes several spurious peaks. These erroneous peaks are the result of the angular separation of dynamically and kinematically diffracted radiation. The above separation of the diffracted radiation occurs when the diffraction takes place near, instead of on, a reciprocal lattice point, at one of the spectrometer s crystals.en
heal.publisherIOP Publishing Ltden
heal.journalNameJournal of Physics E: Scientific Instrumentsen
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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