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https://olympias.lib.uoi.gr/jspui/handle/123456789/14932Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Alexandropoulos Ν.G. | en |
| dc.contributor.author | Kotsis Κ.Τ. | en |
| dc.date.accessioned | 2015-11-24T17:44:39Z | - |
| dc.date.available | 2015-11-24T17:44:39Z | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/14932 | - |
| dc.rights | Default Licence | - |
| dc.title | Umweg peak high resolution flat crystal Χ-ray spectrometer | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.secondary | http://www.sciencedirect.com/science/article/pii/003810989290607B | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών Αγωγής. Παιδαγωγικό Τμήμα Δημοτικής Εκπαίδευσης | el |
| heal.publicationDate | 1992 | - |
| heal.abstract | The construction of an X-ray wavelength dispersive flat crystal spectrometer using an n-beam diffraction peak is presented here. Such a spectrometer, although it is as simple as a flat crystal Bragg spectrometer, provides higher energy resolution than any other wavelength dispersive spectrometer available today. We demonstrate that by selecting the appropriate crystal and umweg peak for the under investigation wavelength area, the energy resolution can exceed the value.... | en |
| heal.journalName | Solid State Communications | en |
| heal.journalType | peer-reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kotsis-1992-Umweg peak high resolution.pdf | 321.33 kB | Adobe PDF | View/Open Request a copy |
This item is licensed under a Creative Commons License
