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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Alexandropoulos Ν.G. | en |
| dc.contributor.author | Kotsis Κ.Τ. | en |
| dc.date.accessioned | 2015-11-24T17:44:33Z | - |
| dc.date.available | 2015-11-24T17:44:33Z | - |
| dc.identifier.uri | https://olympias.lib.uoi.gr/jspui/handle/123456789/14921 | - |
| dc.rights | Default Licence | - |
| dc.title | Umweg peak intensity dependence οn the incident Χ-ray beam polarization mode | en |
| heal.type | journalArticle | - |
| heal.type.en | Journal article | en |
| heal.type.el | Άρθρο Περιοδικού | el |
| heal.identifier.primary | 10.1016/0038-1098(94)90421-9 | - |
| heal.identifier.secondary | http://www.sciencedirect.com/science/article/pii/0038109894904219 | - |
| heal.language | en | - |
| heal.access | campus | - |
| heal.recordProvider | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών Αγωγής. Παιδαγωγικό Τμήμα Δημοτικής Εκπαίδευσης | el |
| heal.publicationDate | 1994 | - |
| heal.abstract | The measured intensities of the three beam X-ray diffraction View the MathML source on silicon crystal, for two modes of polarization, show strong dependence from the polarization mode of the incoming X-ray beam. These results are interpreted within the kinematical theory of X-ray diffraction indicating that when the diffracted beam by the secondary plane is parallel to the crystal surface the kinematical approach is a valid approximation. | en |
| heal.journalName | Solid State Communications | en |
| heal.journalType | peer-reviewed | - |
| heal.fullTextAvailability | TRUE | - |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Kotsis-1994-Umweg peak intensity dependence.pdf | 181.14 kB | Adobe PDF | View/Open Request a copy |
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