Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14235| Title: | Multiwavelength interferometry and competing optical methods for the thermal probing of thin polymeric films |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | glass transition,thin polymeric films,spectroscopic ellipsometry,interferometry,coefficient of thermal expansion,poly(methyl methacrylate),lithography,glass-transition-temperature,poly(methyl methacrylate),thickness dependence,t-g,substrate,ellipsometry,spectroscopy,photoresist,surfaces |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14235 |
| ISSN: | 0021-8995 |
| Link: | <Go to ISI>://000241593700091 http://onlinelibrary.wiley.com/store/10.1002/app.25107/asset/25107_ftp.pdf?v=1&t=h3fkdnv5&s=81b182832b0e904e918b7866c13bba8d6dd1e91a |
| Publisher: | Wiley |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Beltsios-2006-Multiwavelength interferometry.pdf | 744.26 kB | Adobe PDF | View/Open Request a copy |
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