Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/14045
Title: In situ and real-time ellipsometry diagnostic techniques towards the monitoring of the bonding structure and growth kinetics: silicon oxide coatings
Institution and School/Department of submitter: Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών
Keywords: in situ,real-time,spectroscopic ellipsometry,optical properties,silicon oxide,chemical-vapor-deposition,films
URI: https://olympias.lib.uoi.gr/jspui/handle/123456789/14045
ISSN: 0257-8972
Link: <Go to ISI>://000174011400042
Publisher: Elsevier
Appears in Collections:Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)

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