Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/13854| Title: | Effect of annealing environment on the memory properties of thin oxides with embedded Si nanocrystals obtained by low-energy ion-beam synthesis |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | implantation,states |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/13854 |
| ISSN: | 0003-6951 |
| Link: | <Go to ISI>://000183877800057 http://link.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000083000001000168000001 |
| Publisher: | American Institute of Physics |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Beltsios-2003-Effect of annealing environment.pdf | 421.98 kB | Adobe PDF | View/Open |
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