Title | Author(s) | Issue date | ???itemlist.??? |
Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy | Kitsara, M.; Petrou, P.; Kontziampasis, D.; Misiakos, K.; Makarona, E.; Raptis, I.; Beltsios, K. | 24-Nov-2015 | - |
Composite chemical sensors based on carbon-filled patterned negative resists | Chatzandroulis, S.; Andreadis, N.; Goustouridis, D.; Quercia, L.; Raptis, I.; Beltsios, K. | 24-Nov-2015 | - |
Electrical and optical evaluation of polymer composites for chemical sensing applications | Dendrinos, G.; Quercia, L.; Raptis, I.; Manoli, K.; Chatzandroulis, S.; Goustouridis, D.; Beltsios, K. | 24-Nov-2015 | - |
Fabrication of conductometric chemical sensors by photolithography of conductive polymer composites | Andreadis, N.; Chatzandroulis, S.; Goustouridis, D.; Kosma, V.; Beltsios, K.; Raptis, I. | 24-Nov-2015 | - |
Label-free kinetic study of biomolecular interactions by white light reflectance spectroscopy | Zavali, M.; Petrou, P. S.; Kakabakos, S. E.; Kitsara, M.; Raptis, I.; Beltsios, K.; Misiakos, K. | 24-Nov-2015 | - |
Layer-by-layer UV micromachining methodology of epoxy resist embedded microchannels | Kitsara, M.; Chatzichristidi, M.; Niakoula, D.; Goustouridis, D.; Beltsios, K.; Argitis, P.; Raptis, I. | 24-Nov-2015 | - |
Molecular weight and processing effects on the dissolution properties of thin poly(methyl methacrylate) films | Kokkinis, A.; Valamontes, E. S.; Goustouridis, D.; Ganetsos, T.; Beltsios, K.; Raptis, I. | 24-Nov-2015 | - |
Multiwavelength interferometry and competing optical methods for the thermal probing of thin polymeric films | Vourdas, N.; Karadimos, G.; Goustouridis, D.; Gogolides, E.; Boudouvis, A. G.; Tortai, J. H.; Beltsios, K.; Raptis, I. | 24-Nov-2015 | - |
Polymer based chemical sensor array fabricated with conventional microelectronic processes | Kitsara, M.; Goustouridis, D.; Valamontes, E.; Oikonomou, P.; Beltsios, K.; Raptis, I. | 24-Nov-2015 | - |
Thickness-dependent glass transition temperature of thin resist films for high resolution lithography | Marceau, S.; Tortai, J. H.; Tillier, J.; Vourdas, N.; Gogolides, E.; Raptis, I.; Beltsios, K.; van Werden, K. | 24-Nov-2015 | - |