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Author
2
Dimitriadis, C. A.
2
Kamarinos, G.
2
Lee, J. I.
1
Tassis, D. H.
Subject
2
1/f noise
2
barrier diodes
2
metal
2
silicon
2
thin-films
2
titanium nitride
1
defects
1
deposition temperature
1
in-situ
1
low frequency noise
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Item Type
2
journalArticle
Date
2
1999
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Επιστήμης Υλικών
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering (Journal article)
Low frequency noise measurements on TiN/n-Si Schottky diodes (Journal article)