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Author
10
Arapoyanni, A.
8
Haniotakis, T.
4
Nikolos, D.
3
Chrisanthopoulos, A.
3
Kamoulakos, G.
2
Efstathiou, C.
2
Matakias, S.
2
Moisiadis, Y.
1
Chakrabarty, K.
1
Dermentzoglou, L.
.
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Subject
3
design for testability
2
circuits
2
design
1
analog
1
band-gap reference circuits
1
built-in-test (bit)
1
charge pump circuits
1
charge recycling
1
cmos logic
1
comparator
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Item Type
14
journalArticle
Date
2
2010 - 2013
12
2000 - 2009
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
Τμήμα Μηχανικών Ηλεκτρονικών Υπολογιστών και Πληροφορικής
Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά)
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Results 11-14 of 14 (Search time: 0.003 seconds).
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A new technique for I(DDQ) testing in nanometer technologies (Journal article)
Domino CMOS SCD/SFS 2-out-of-3 and 1-out-of-3 code checkers (Journal article)
A design for testability scheme for CMOS LC-Tank voltage controlled oscillators (Journal article)
A circuit for concurrent detection of soft and timing errors in digital CMOS ICs (Journal article)