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Author
4
Evangelou, E. K.
3
Dimoulas, A.
3
Mavrou, G.
3
Rahman, M. S.
2
Androulidakis, I. I.
2
Galata, S.
1
Anagnostopoulos, D. F.
1
Borchert, G. L.
1
Dieker, C.
1
Dirnoulas, A.
.
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2
breakdown
2
interface
1
beam deposition
1
conduction
1
deposition
1
devices
1
dy(2)o(3)
1
electrical properties and measure...
1
gate dielectric stacks
1
ge surface passivation
.
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Item Type
4
journalArticle
Date
1
2010
1
2009
2
2008
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ΑΠΟΘΕΤΗΡΙΟ "ΟΛΥΜΠΙΑΣ"
Σχολή Θετικών Επιστημών
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Study of stress-induced leakage current (SILC) in HfO(2)/Dy(2)O(3) high-kappa gate stacks on germanium (Journal article)
Electrical properties of La(2)O(3) and HfO(2)/La(2)O(3) gate dielectrics for germanium metal-oxide-semiconductor devices (Journal article)
Anomalous charge trapping dynamics in cerium oxide grown on germanium substrate (Journal article)
Structural and electrical properties of HfO(2)/Dy(2)O(3) gate stacks on Ge substrates (Journal article)