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Please use this identifier to cite or link to this item: https://olympias.lib.uoi.gr/jspui/handle/123456789/17516
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dc.contributor.authorEvangelou, I.en
dc.contributor.authorKokkas, P.en
dc.contributor.authorManthos, N.en
dc.contributor.authorProuskas, C.en
dc.contributor.authorTriantis, F.en
dc.contributor.authorTzoulis, N.en
dc.contributor.authorAspell, P.en
dc.contributor.authorBarney, D.en
dc.contributor.authorBloch, P.en
dc.contributor.authorKloukinas, K.en
dc.contributor.authorPeisert, A.en
dc.contributor.authorReynaud, S.en
dc.contributor.authorGo, A.en
dc.contributor.authorElsha, V.en
dc.contributor.authorZubarev, E.en
dc.contributor.authorCheremukhin, A.en
dc.contributor.authorZamiatin, N.en
dc.date.accessioned2015-11-24T18:39:53Z-
dc.date.available2015-11-24T18:39:53Z-
dc.identifier.issn0168-9002-
dc.identifier.urihttps://olympias.lib.uoi.gr/jspui/handle/123456789/17516-
dc.rightsDefault Licence-
dc.subjectcmsen
dc.subjectpreshoweren
dc.subjectsilicon stripsen
dc.subjectnoiseen
dc.titleNoise measurements on Si sensorsen
heal.typejournalArticle-
heal.type.enJournal articleen
heal.type.elΆρθρο Περιοδικούel
heal.identifier.secondary<Go to ISI>://000178895500004-
heal.identifier.secondaryhttp://ac.els-cdn.com/S0168900202015565/1-s2.0-S0168900202015565-main.pdf?_tid=5a478c6cab89e09450156f1606a4df8f&acdnat=1334228577_71a572a2575cddc7c2fe95b225c8a6d7-
heal.languageen-
heal.accesscampus-
heal.recordProviderΠανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιώνel
heal.publicationDate2002-
heal.abstractDeveloping silicon strip sensors for the CMS Preshower detector we have noticed that some strips have a noise higher than the average and not correlated to a high leakage current. In order to investigate this effect we have developed a setup for noise measurement on wafers and diced sensors that does not require bonding. The set-up is based on the DeltaStream chip coupled to a probe card. We have tested 45 sensors and found that the strips with an above average noise have a higher relative current increase as a function of voltage, DeltaI/(IDeltaV). We also observed that, on these strips, the breakdown occurs within about 60 V from the voltage at which the noise is observed. We describe our measurement method and present the results. (C) 2002 Elsevier Science B.V. All rights reserved.en
heal.journalNameNuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipmenten
heal.journalTypepeer reviewed-
heal.fullTextAvailabilityTRUE-
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