Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/16643| Title: | Anomalous charge trapping dynamics in cerium oxide grown on germanium substrate |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Επιστημών και Τεχνολογιών. Τμήμα Βιολογικών Εφαρμογών και Τεχνολογιών |
| Keywords: | gate dielectric stacks,semiconductor devices,hfo2,generation,capacitors,interface,breakdown,layers |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/16643 |
| ISSN: | 0021-8979 |
| Link: | <Go to ISI>://000254536900130 http://link.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000103000006064514000001 |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) - ΦΥΣ |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Rahman-2008-Anomalous charge tra.pdf | 421.14 kB | Adobe PDF | View/Open Request a copy |
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