Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14550| Title: | Structure-dependent electronic properties of nanocrystalline cerium oxide films |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | ceo2 thin-films,ion-assisted deposition,pulsed-laser deposition,optical-properties,spectroscopic ellipsometry,transport-properties,epitaxial-growth,silicon,dioxide,si(111) |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14550 |
| ISSN: | 1098-0121 |
| Link: | <Go to ISI>://000185229600041 |
| Publisher: | American Physical Society |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-2003-Structure-dependent electronic properties.pdf | 197.47 kB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License
