Please use this identifier to cite or link to this item:
https://olympias.lib.uoi.gr/jspui/handle/123456789/14414| Title: | Real-time monitoring, growth kinetics and properties of carbon based materials deposited by sputtering |
| Institution and School/Department of submitter: | Πανεπιστήμιο Ιωαννίνων. Σχολή Θετικών Επιστημών. Τμήμα Μηχανικών Επιστήμης Υλικών |
| Keywords: | amorphous carbon,sputtering,ellipsometry,modeling,amorphous-carbon,spectroscopic ellipsometry,optical-properties,thin-films,phenomenological model,ion irradiation,roughness |
| URI: | https://olympias.lib.uoi.gr/jspui/handle/123456789/14414 |
| ISSN: | 0925-9635 |
| Link: | <Go to ISI>://000167483900002 |
| Publisher: | Elsevier |
| Appears in Collections: | Άρθρα σε επιστημονικά περιοδικά ( Ανοικτά) |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Patsalas-2001-Real-time monitoring.pdf | 287.72 kB | Adobe PDF | View/Open Request a copy |
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